Supplementary Material
figure
posted on 2024-12-12, 13:04 authored by James Spencer Lundh, Cory Cress, Alan Jacobs, Zhe Cheng, Hannah Masten, Joseph Spencer, Kohei Sasaki, James Gallagher, Andrew Koehler, Keita Konishi, Samuel Graham, Akito Kuramata, Travis Anderson, Marko Tadjer, Karl Hobart, Michael MastroSupplementary material includes electrical simulation (Silvaco) of uncapped and AlN-capped HFETs under OFF-state bias conditions.
