Supplementary Material
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posted on 2024-10-30, 12:00 authored by Carl Peterson, Arkka Bhattacharyya, Kittamet Chanchaiworawit, Rachel Kahler, Saurav Roy, Yizheng Liu, Steve Rebollo, Anna Kallistova, Tom Mates, Sriram KrishnamoorthyThe supplementary material contains additional data and discussions regarding the cross-sectional SEM image of a growth rate calibration sample, annealed vs. un-annealed Hall pad I-V profiles, four-corner vs. mesa isolated Van Der Pauw Hall structures, AFM and DIC microscope surface analysis of all samples, and SIMS measurements of background impurities at detection limit.
