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posted on 2024-10-11, 12:06 authored by Ahmad Abed, Rebecca Peterson
The supplementary material contains a cross-sectional HAADF STEM image, an AFM image of a film deposited with no oxygen flux and no subsequent PDA, and GIXRD traces for films deposited with 20% and 30% O2 flux during growth and annealed at 950 oC in O2 ambient.

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    JVST A: Vacuum, Surfaces, and Films

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