Supplementary Material
figure
posted on 2024-07-22, 04:02 authored by Anton Khanas, Christian Hebert, David Hrabovsky, Loic Becerra, Nathalie JedrecyAdditional information on X-ray diffraction and reflectivity, I(V) curve measurement, MR measurements at various T, M(H) loops and MR measurements for additional samples (grown with different barrier thickness and on different substrate), and M(H) loop deconvolution method.
