posted on 2024-05-29, 11:50authored byEmma Bergeron, Francois Sfigakis, Ahmed Elbaroudy, Andrew Jordan, Fiona Thompson, George Nichols, Yinqiu Shi, Man Chun Tam, Zbignew Wasilewski, Jonathan Baugh
The supplementary material contains additional information on MBE growth, bandstructure profiles, sample fabrication, characterization of Hall bars, and I-V/MAR traces of SNS junctions.