AIP Publishing
Browse

Supplementary Information

Download (2.05 MB)
figure
posted on 2025-02-25, 13:02 authored by Tizian Lorenzen, Benedikt Diederichs, Charles Ogolla, Benjamin Butz, Knut Müller-Caspary
Supplementary Figures

History

Related Materials

  1. 1.
    DOI - Is supplement to Aberration measurement by electron ptychography and consistency among different algorithms

Usage metrics

    Applied Physics Letters

    Categories

    Keywords

    PtychographyAberration measurementTransmission electron microscopy

    Licence

    CC BY 4.0

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC