Supplementary Figs. 1-3
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posted on 2024-11-25, 05:05 authored by Yangheng Chen, Yaodong Wang, Jianjun LiSupplementary Figs. 1-3 show the microstructure and shear strain evolution during the deformation in the samples with layer thickness between 10 and 20 nm, i.e., 12.5 nm, 15 nm and 17.5 nm. The correlated deformation mechanism has been discussed in the accompanying texts in the supplementary materials.
