Supplemental materials
figure
posted on 2024-07-22, 04:03 authored by Zhe Guo, Zheng Duan Zhang, Xiao Qiang Liu, Xiang Ming ChenThe experimental details for materials synthetic process and characterizations, the XRD patterns, details for the Rietveld refinement results, the SEM and TEM images, the detailed measuring process of the PUND method, and the temperature-dependent dielectric responses over the temperature range from 173 - 573 K
