Supplemental material files
figure
posted on 2024-08-28, 12:00 authored by Rongli Deng, Xingchen Pan, Guanzhao Yang, Haibin Lin, Junyong Li, Richard NötzelSEM top-view images，XRD spectra and PL spectra，Large-scale top-view SEM images，OCP measurements as a function of the Cl- concentration，Top-view AFM image and AFM height image of the InN/InGaN QDs
