Supplemental figure S1
figure
posted on 2025-07-30, 12:04 authored by Chun-Sheng Jiang, Hongling Lott, Andrea Mathew, Marco Nardone, Eric Colegrove, Matthew ReeseFigure S1. SSRM images taken on two more randomly selected areas at the back surface of the same polycrystalline Cd(Se,Te) sample as shown in Figure 7, to make sure representative resistance features observed by SSRM.
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- 1. DOI - Is supplement to Nm-Scale Electrical Resistance Imaging on CdTe by Scanning Spreading Resistance Microscopy
