AIP Publishing
Browse

Supplemental Online Material

Download (779.65 kB)
figure
posted on 2025-03-26, 12:05 authored by Sujung Kim, Becker Sharif, Scott Dhuey, Thomas Yuzvinsky, Wei-Gang Yang, David Lederman, Holger Schmidt
Derivation of resonant frequency (S1), x-ray analysis (S2), validation of patterning process (S3).

History

Usage metrics

    Journal of Applied Physics

    Categories

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC