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Supplemental Materials: Dynamic Evolution of Oxygen Vacancies During Cycling in Antiferroelectric HfxZr1-xO2

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posted on 2024-06-14, 11:50 authored by Haoji Qian, Rongzong Shen, Hongrui Zhang, Jiacheng Xu, Gaobo Lin, Yian Ding, Jiani Gu, Xiao Yu, Yan Liu, Chengji Jin, jiajia Chen, Genquan Han
Q-V loops with different RTA temperatures, structure characteristics by HRTEM and EDS mapping, charge release by bi-directional cycling and stress activation and its physical mechanism

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