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posted on 2024-03-14, 11:55 authored by AIP AdminAIP Admin, Tao Xiong, Xiuming Dou, Wen-Feng Li, Hongyu Wen, Hui-Xiong Deng, Yue-Yang Liu
Supplemental Material - Carrier Injection Induced Degradation of Nitrogen Passivated SiC-SiO2 Interface Simulated by Time-dependent Density Functional Theory

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    Journal of Applied Physics

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    SiC-SiO2Carrier Injectioninterface degradation

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    CC BY-NC 4.0

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