- No file added yet -

Supplemental Material

figure

posted on 2024-09-23, 04:02 authored by Yu-Mi Wu, Pascal Puphal, Masahiko Isobe, Bernhard Keimer, Matthias Hepting, Y. Eren Suyolcu, Peter A. van Aken

Additional experimental characterization of the samples including SEM images, STEM HAADF images, STEM EELS maps and STEM EDXS data

History

Usage metrics

Keywords

Electron microscopy Electron energy-loss spectroscopy High temperature superconductors

Licence

CC BY 4.0

Exports

RefWorks

BibTeX

Ref. manager

Endnote

DataCite

NLM

DC