posted on 2024-07-09, 12:01authored byAnastasios Markou, James Taylor, Jacob Gayles, Yan Sun, Dominik Kriegner, Joerg Grenzer, Shanshan Guo, Walter Schnelle, Edouard Lesne, Claudia Felser, Stuart Parkin
Supplemental material detailing thin-film deposition recipes, extended x-ray diffraction characterization, computational methods, magnetic and transport measurement procedures, exchange bias results for a thinner bilayer, and electrical transport measurements at low temperature.