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Supplement S1 and S2

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posted on 2025-02-10, 05:09 authored by Zsófia Baji, Zsolt Fogarassy, Attila Sulyok, Zsolt Horváth, Zoltán Szabó
S.1. XRD measurement of the annealed layer on silicon. No characteristic peaks can be observed S.2. FFT analysis of the as-deposited amorphous layer

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    JVST A: Vacuum, Surfaces, and Films

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    FFT

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