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posted on 2025-04-02, 12:03 authored by Wenhao Li, Kun Gao, Shibo Wang, Wei Shi, Fengxian Cao, Wenhao Li, Haicheng Li, Xiang Chen, Jun Zhou, Peng Xie, Yao Li, Xinbo YangAdditional data on specific experimental section, the Plot of (αhv)2 against photon energy and the XPS survey spectrum. Details related to the contact resistivity and implied open-circuit voltage (iVoc) as a function of annealing temperature, the PCE as a function of the TaOxNy film thickness, and Statistical Distribution of the Voc and FF for n-Si Cell are also provided.
