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posted on 2025-11-17, 05:02 authored by Huadong Yu, Huapei Zhu, Wen An, Shuanhu Wang, Hong Yan, Kexin Jin
the supplementary material for the schematic diagram of UV treating process, the comparison of the surface morphology of STO characterized by AFM before and after UV treatment, the XRD image of the HZO/STO heterostructure, and Rs-T curves of samples with different thicknesses under the same preparation conditions

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    Applied Physics Letters

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    Complex oxides interfaces2DEGHafnia-based ferroelectricsTransport properties

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