figure
posted on 2025-10-10, 12:01 authored by Wentian Zhang, Qian Yang, Shen Zhang, Binjie Chen, Long Zhang, Shun Li, Jianming Zhang, Suci Meng, Jingbo Wu, Yuqiao ZhangThe Supporting Information provides comprehensive characterizations, including reflection high-energy electron diffraction (RHEED), surface morphology analyses, spectral response measurements, among other characterizations.
