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posted on 2025-07-18, 12:03 authored by Xueqiang Yu, Xiaodong Xu, Hao Jiang, Lei Wu, Fengkai Liu, Weiqi Li, Zhongli Liu, Hongbin Geng, Jianqun Yang, Xingji Li
Supplement for the electric field distribution under operating conditions influence the effect or distribution of these defects

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    Applied Physics Letters

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    Electric field on defect formation in 4H-SiC

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