Supplement Number 1

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posted on 2025-07-09, 12:04 authored by Xueying Sun, Junye Li, Peng Zhao, Rui Qi, Yingchao Liu, Haining Ji, Handong Li, Xiaobin Niu, Zhiming Wang

The RHEED patterns, X-ray photoelectron spectroscopy analysis and Energy-dispersive X-ray Spectroscopy analysis on (Bi1-xInx)2Te3 films

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DOI - Is supplement to <strong>Van der Waals epitaxy of (Bi<em><sub>1-x</sub></em>In<em><sub>x</sub></em>)<em><sub>2</sub></em>Te<em><sub>3</sub></em> solid solutions with a broad operating temperature range for thin-film thermoelectrics</strong>

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Engineering

Keywords

(Bi1-xInx)2Te3 RHEED patterns X-ray photoelectron spectroscopy Energy-dispersive X-ray Spectroscopy

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