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Supplement Number 1

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posted on 2025-05-16, 12:08 authored by Susumu Imashuku
Wavelength and transition of Ti I lines comprising single emission lines without overlapping with Ar I or Ar II lines, and R2 values for plots of the emission intensity ratio of Ti I lines to C I 247.9 nm line as a function of the Ti/C atomic ratio in deposited films during TiC target sputtering at 5 and 10 Pa.

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    JVST B: Nanotechnology and Microelectronics

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