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posted on 2025-02-19, 13:02
authored by
Huan Liu
,
Lixiang Rao
,
Junjie Qi
,
Gang Tang
(i) electronic properties of Bi2XO5 (X=Se, Te) monolayers (ii) structure stability of Bi2XO5 (X=Se, Te) monolayers (iii) calculation method of leakage current
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Categories
Physical sciences
Information and computing sciences
Keywords
van der Waals layered materials
gate dielectrics
permittivity
leakage current
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CC BY 4.0
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