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posted on 2025-02-19, 13:02 authored by Huan Liu, Lixiang Rao, Junjie Qi, Gang Tang
(i) electronic properties of Bi2XO5 (X=Se, Te) monolayers (ii) structure stability of Bi2XO5 (X=Se, Te) monolayers (iii) calculation method of leakage current

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    Applied Physics Letters

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    van der Waals layered materialsgate dielectricspermittivityleakage current

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