Supplement Number 1
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posted on 2024-10-14, 04:01 authored by Wenxing Huo, Yonghui Zhang, Chenglong Fang, Ziyue Wu, Zhen Yang, Sui Mao, Xinyu Liu, Yang Qin, Rui Zhu, Zengxia Mei, Xian HuangThe transfer and output curves of TFTs (Figures S1, S2, and S3), breakdown behavior of TFTs without offset (Fig. S4), benchmarking of the oxide HV-TFTs to the one-dimensional IGZO limit (Fig. S5), the simulated results (Figures S6, S7, and S8), and a summary of the fabrication conditions and parameters of HV-TFTs (TABLE SI).
