posted on 2024-07-16, 12:02authored byLindsey Gray, Kadaba Swathi, Dundappa Mumbaraddi, Timothy Carlson, Gabriel Marcus, David Caroll
The supplementary material includes experimental details and methods, AFM, SEM, and TEM images of nanoplates and thin films, XPS spectra, XRD Rietveld refinement plots and parameter table, and elemental mapping of the nanoplates.