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Supplement Number 1

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posted on 2024-06-10, 04:04 authored by Chang Lu, Min Gao, Junxiao Liu, Yantong Lu, Tianlong Wen, Yuan Lin
supplementary material for comprehensive experimental details on film thickness measurements, XRD analysis for epitaxial growth characterization, and findings indicating the negligible thermal effect of the incident laser in in-situ Raman scattering measurements.

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    Journal of Applied Physics

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