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posted on 2024-03-28, 11:55 authored by Rebeca M. Gurrola
Additional material characterization including SRIM simulations, AFM surface morphology, Raman mapping, and TEM

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    Journal of Applied Physics

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    Keywords

    Stopping and Range of Ions in Matter (SRIM)AFMRaman MappingTEM

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    CC BY 4.0

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