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Supplement Number 1

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posted on 2024-02-15, 12:55 authored by AIP AdminAIP Admin, Wei Shi, Yangkai Wang, Hongchuan He, Qiuping Huang, Zhengping Fu, Jianlin Wang, Yalin Lu
The X-ray diffraction (XRD) pattern of the NiO sample, the infrared thermography results under different excitation powers, the temperature distribution in the simulated NiO sample at different time and the (001)-oriented NiO sample experimental results.

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    Journal of Applied Physics

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    Keywords

    NiOthermography

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    CC BY 4.0

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