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Supplement Material

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posted on 2024-08-14, 04:01 authored by Yanlong Lv, Xin Sun, Changhua Mi, Jianan Gu, Yanhong Wang, Meicheng Li

See the supplementary material for detailed calculation and electrotest methods, TEM mapping images, SEM images, XRD spectra, XPS spectra, Mott-Schottky plots, and CV plots of fabricated samples, and comparison of samples after long term stability tests.