Skip to main content
Browse
Browse and Search
Search
Supplement1
Cite
Download
(514.33 kB)
Share
Embed
figure
posted on 2025-03-21, 12:02
authored by
Taichi Nogami
,
Issei Suzuki
,
Daiki Motai
,
Hiroshi Tanimura
,
Tetsu Ichitsubo
,
Takahisa Omata
Evaporation amount of sulfur and plasma emissions, out-of-plane XRD analysis, strain analysis with Willamson-Hall method, Seebeck coefficient measurements, temperature dependence of electrical conductivity, and spectroscopic ellipsometry analysis.
History
Usage metrics
0
0
0
Categories
Chemical sciences
Keywords
Tin sulfide
Defect
Sputtering
Solar cells
Thin film
Licence
CC BY 4.0
Exports
Select an option
RefWorks
RefWorks
BibTeX
BibTeX
Ref. manager
Ref. manager
Endnote
Endnote
DataCite
DataCite
NLM
NLM
DC
DC