figure
posted on 2025-11-26, 13:06 authored by Andriy Nadtochiy, Artem Podolian, Oleg Korotchenkov, Oleksandr Oberemok, Oleksandr Dubikovskyi, Oleksandr Gudymenko, Oleksandr Kosulya, Borys RomanyukDetails on the measurement of optical transmittance of the metal mesh electrode and teflon. It also contains the simulated results of the equivalent circuit shown in Fig. 2 describing the SPV measurement setup (Fig. 1), the $I-V$ characteristics and electrical conductivity measurement setup, and the SPV transients measured on the Si substrate.
