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posted on 2025-11-11, 13:05 authored by Stanley McCombs, Ahamed Raihan, Owen Vail, Paul Haghi-Ashtiani, Alexander Samokhvalov, Dereje Seifu
Numerical fitting data for Raman, SEM image, SAED, XRD, EDS, XPS, IV characterization, and AFM height profile.

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