figure
posted on 2025-11-11, 13:05 authored by Stanley McCombs, Ahamed Raihan, Owen Vail, Paul Haghi-Ashtiani, Alexander Samokhvalov, Dereje SeifuNumerical fitting data for Raman, SEM image, SAED, XRD, EDS, XPS, IV characterization, and AFM height profile.
History
Related Materials
Usage metrics
Categories
Keywords
Licence
Exports
RefWorksRefWorks
BibTeXBibTeX
Ref. managerRef. manager
EndnoteEndnote
DataCiteDataCite
NLMNLM
DCDC


