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posted on 2025-03-12, 12:02 authored by Songhao Gu, Ke Xu, Mei Cui, Fang-Fang Ren, Shulin Gu, Rong Zhang, Jiandong Ye
Supllemental Online Materials

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    Applied Physics Letters

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    Keywords

    X-ray Diffraction PatternsHigh-resolution TEMAtomic Force Microscopy

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    CC BY 4.0

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