Spplement Number 1
figure
posted on 2024-07-09, 12:00 authored by Takuya Maeda, Yusuke Wakamoto, Shota Kaneki, Hajime Fujikura, Atsushi KobayashiThe Psi and Delta measured by the variable-angle spectroscopic ellipsometry. For the GaN substrates, the consistent and constant parameters were used, and the parameters for ScAlN films were changed. The excellent fittings were obtained for all the samples.
