posted on 2025-07-02, 12:06authored byEswaran Jayaraman, Kun Wang, Jani Lamminaho, Chun Yuen Ho, Jens Andreasen, Morten Madsen
more information on slot-die coating parameters for small and mini-module development of OPVs; dark J-V comparison of fresh and thermally degraded devices; EQE comparison of fresh and thermally degraded devices; transient photocurrent (TPC) lifetime of fresh and thermally degraded devices; light intensity-dependent current density plots and corresponding tabulated values; UV-Vis spectra of fresh and thermally degraded devices; device performance before and after applying a long-pass filter; and a list of performance metrics for reference printed devices.