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SUPPLEMENTARY MATERIAL

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posted on 2024-06-10, 04:01 authored by Peerawat Laohana, Wanwisa Limphirat, Kriettisak Srisom, Pattanaphong Janphuang, Worawat Meevasana, Wittawat Saenrang
SUPPLEMENTARY MATERIAL includes Photolithography techniques, Atomic force microscopy (AFM), Energy-dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), Conductance measurement, and Time-resolved X-ray absorption spectroscopy (TRXAS)

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    Applied Physics Letters

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    Keywords

    electrical conductanceBiFeO3/Silocal structural properties

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    CC BY 4.0

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