AIP Publishing
Browse
FIG_S-3.tif (1.44 MB)

FIG S-2

Download (1.44 MB)
figure
posted on 2024-01-10, 12:55 authored by M. Stabentheiner, P. Diehle, S. Hü, bner, M.Lejoyeux, F. Altmann, R. Neumann, A.A. Taylor, D.Pogany, and C. Ostermaier
FIG S-2: SEM images of different steps during the cross-sectional lamella preparation. (a) protection layers are placed on top and at the bottom of the planar lamella as stabilization. (b) the lamella after FIB milling before lift-out. (c) manipulators during the in-situ lift-out procedure. (d) STEM overview image of the final sample after polishing.

History

Usage metrics

    Journal of Applied Physics

    Categories

    Keywords

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC