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posted on 2025-01-08, 13:03 authored by Yuhao Duan, Deming Zhao, Zhonglin Li, J. Yu, Yao Liang, Ying Wang
Supplement to the content of the manuscript

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    Journal of Applied Physics

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    Two-dimensional telluriumAngle-resolved polarized Raman spectroscopyCrystal axis identificationPolarized Raman intensity simulation

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