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Supporting information

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posted on 2024-05-22, 11:55 authored by M. Merkx, İlker Tezsevin, Pengmei Yu, Thijs Janssen, Rik Heinemans, Rik Lengers, Jiun-Ruey Chen, Christopher Jezewski, Scott Clendenning, W. Kessels, Tania Sandoval, Adriaan Mackus
Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after aniline adsorption at various temperatures measured by XPS.

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