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posted on 2025-09-03, 12:08 authored by Anish More, William Ebmeyer, Pratik Dholabhai
Supporting Information Figure 1 and Figure 2

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    DOI - Is supplement to <strong>Mechanisms for oxygen vacancy defect migration in SrTiO<sub>3</sub>/NiO heterostructures: Effect of interface layer chemistry and misfit dislocation structure</strong>

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    Journal of Applied Physics

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    Oxide thin films and heterostructureHigh-throughput computingSolid oxide fuel cell electrolytesMolecular dynamicsComputational materials science

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