posted on 2025-07-31, 12:04authored byZhanfeng Wang, Jiahe Zhang, Gang Jia, Weidong Sun, Saibo Yin, Jiangzhen Niu, Jianting Bai, Chang Liu, Zhen Zhao, Xiaobing Yan
See the supplementary material for the XRD patterns, morphological scans, and PFM ferroelectric polarization tests of AlScN films with different Sc doping ratios; the I-V characterization curves of AlScN thin films under different Sc target sputtering powers; and the mathematical description of weight modulation in the STDP circuit model.