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posted on 2025-01-27, 05:04 authored by Xinli Wang, Zhentao Fu, Peng-Fei Liu, Bao-Tian Wang, Wen Yin
The Supplemental Material includes the size testing of 2QL-Al2O3 interfaces, the IDS-VDS output curves of QLs-Al2O3 filed effect transistor devices, and electronic properties of 2QLs-Al2O3 interfaces with MgAl-OH and VAl3- defects.

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    Applied Physics Letters

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