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posted on 2025-09-26, 12:07 authored by Claire Wu, Mythili Surendran, Anika Priyoti, Gokul Anilkumar, Cheng-Hsien Wu, Chun-Chen Wang, Cheng-Chen Kuo, Harish Kumarasubramanian, Kenta Lin, Amari Butler, Rehan Kapadia, Xinyu Bao, Jayakanth Ravichandran
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    DOI - Is supplement to <strong>Textured growth and electrical characterization of Zinc Sulfide thin films on back-end-of-the-line (BEOL) compatible substrates</strong>

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    JVST A: Vacuum, Surfaces, and Films

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    Semiconductorstransistorsback end of the linep-typeZnS

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