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Supplementary material

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posted on 2024-05-01, 11:52 authored by Hong-rae Cho, Joon Hyung Park, Somi Kim, Kannan Udaya Mohanan, Sungyeop Jung, Chang-Hyun Kim
Supplementary material for further details on the simulation method, cross-sectional TEM images, linear regression of the capacitance-area relationship, and comparison between the electrical characteristics of the Au(bottom)/DNTT/Al(top) and Al(bottom)/DNTT/Au(top) diodes

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