posted on 2024-05-01, 11:52authored byHong-rae Cho, Joon Hyung Park, Somi Kim, Kannan Udaya Mohanan, Sungyeop Jung, Chang-Hyun Kim
Supplementary material for further details on the simulation method, cross-sectional TEM images, linear regression of the capacitance-area relationship, and comparison between the electrical characteristics of the Au(bottom)/DNTT/Al(top) and Al(bottom)/DNTT/Au(top) diodes