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posted on 2024-06-04, 13:38 authored by P. S. Padhi, Sanjay Rai, Kritika Vijay, Himanshu Srivastava, Soma Banik, R S Ajimsha, Arvind Kumar Srivastava, Pankaj Misra
Detailed sample fabrication and characterization procedure, XRR best-fit results, TEM sublayer intensity variation profiles, different frequency response regimes of σ_ac profiles, measured and deconvoluted SR-XPS spectra of core levels in 0.8A-0.8T NL

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