posted on 2024-10-16, 12:00authored byHaijuan Zhang, Changqing Zhu, Mingwei Yang, Xin Lu, Jie Chen, Kuijuan Jin, Liming Chen
Sample preparation and static characterizations (S1), Setups of the TR and UXRD measurements (S2), Lattice dynamics in BM-SCO films with different thicknesses (S3), Estimation of the thermal lattice expansion under 400 nm and 800 nm excitation (S4), Detailed analysis of the hot hole filling process observed by the TR measurements (S5) and Estimation for lattice change upon the 400 nm excitation (S6).