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posted on 2025-07-01, 12:16 authored by Mohammadhasan Dinpajooh, Giovanna Ricchiuti, Andrew Ritchhart, Tao Li, Elias Nakouzi, Sebastian Mergelsberg, Venkateshkumar Prabhakaran, Jaehun Chun, Maria Sushko
The Supplementary Material provides detailed descriptions of the Bartington MS2 Magnetic Susceptibility Meter measurements and related analyses. Additionally, it discusses the Small-Angle X-ray measurements conducted in the presence of eMF, as well as the molecular dynamics simulations, Monte Carlo simulations, and classical density functional theory calculations.

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