posted on 2025-06-10, 12:04authored byVittorio Buccheri, Francois Joint, Kazi Rafsanjani Amin, Tosson Elalaily, Olivér Kürtössy, Zoltan Scherubl, Gergő Fülöp, Thomas Kanne, Jesper Nygård, Péter Makk, Szabolcs Csonka, Simone Gasparinetti
The Supplementary Material provides additional information about device fabrication and measurement setup.
It also includes supporting data and extended methodologies regarding frequency-domain spectroscopy, time-domain spectroscopy and sideband spectroscopy.