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posted on 2025-03-05, 13:02 authored by Shimpei Nishiyama, Raisei Mizokuchi, Ryo Matsuda, Jun Kamioka, Jun Yoneda, Tetsuo Kodera
Measurement setup for gate voltage dependences consisting of the parts of lock-in measurements and conductance sensitivity measurements and simulated readout performance

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    Applied Physics Letters

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