Supplementary Material

Name: Supplementary Material
Published: 2025-03-05T13:02:33+00:00
License: https://creativecommons.org/licenses/by/4.0/
Keywords: RF reflectometry, Lock-in measurements

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posted on 2025-03-05, 13:02 authored by Shimpei Nishiyama, Raisei Mizokuchi, Ryo Matsuda, Jun Kamioka, Jun Yoneda, Tetsuo Kodera

Measurement setup for gate voltage dependences consisting of the parts of lock-in measurements and conductance sensitivity measurements and simulated readout performance

Supplementary Material

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